The role of nonlinear dynamics in quantitative atomic force microscopy.

نویسندگان

  • Daniel Platz
  • Daniel Forchheimer
  • Erik A Tholén
  • David B Haviland
چکیده

Various methods of force measurement with the atomic force microscope are compared for their ability to accurately determine the tip-surface force from analysis of the nonlinear cantilever motion. It is explained how intermodulation, or the frequency mixing of multiple drive tones by the nonlinear tip-surface force, can be used to concentrate the nonlinear motion in a narrow band of frequency near the cantilever's fundamental resonance, where accuracy and sensitivity of force measurement are greatest. Two different methods for reconstructing tip-surface forces from intermodulation spectra are explained. The reconstruction of both conservative and dissipative tip-surface interactions from intermodulation spectra are demonstrated on simulated data.

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عنوان ژورنال:
  • Nanotechnology

دوره 23 26  شماره 

صفحات  -

تاریخ انتشار 2012